Two, overview
ST2253 type digital four probe tester is using four probe resistivity measurement test / square resistance multi-purpose comprehensive measuring instrument. The instrument is designed in accordance with GB/T 1551-2009"determination of silicon single crystal resistivity method," GB/T 1552-1995 "silicon, germanium single crystalresistivity measuring DC four probe method and reference USA A.S.T.M standard".
Complete sets of equipment composition: it is composed of host, matching the four probe, test platform and PC software components.
Composed mainly by the host precision constant current source, high resolution ADC, embedded system, USB communication interface. Set all parameters, the instrument host function conversion by digital keyboard and digitalswitch input; with zero, full self correction function; test function can automatically / manually; instrument operation by the software in the PC machine operation to complete, may also be de PC complete by four probe instrument panelof independent operation. Test result data from the host digital tube display, can be connected machine consists ofsoftware interface synchronous display, analysis, save and print!
Probe selection: according to the needs of different material properties, the probe can come in a variety of optional.High wear resistant probe, to test the silicon-based semiconductors, metals, conductive plastics and other hard materials resistivity / square resistance; there are spherical gold-plated copper alloy probe, measurable conductive film, flexible metal coating or film, ceramic or glass substrate conductive film (ITO film) resistivity / or nano coating of semiconductor materials such as square resistance. Replace the four terminal test fixture, also on the resistor body resistance, metal conductor, and low resistance switch contact resistance measurement. With the special probe, can also test the battery pole piece in foil coating resistivity square resistance.
Test selection: general four probe method for testing resistivity / square resistance with SZT-A or SZT-B or SZT-C or SZT-F type test stand. The two probe method for testing resistivity test SZT-K test bench, can also be matching SZT-D test bench to test semiconductor resistivity of the powder, with the SZT-G type test of rubber material resistivity.
See "four probe instrument, the probe and the test characteristics and selection of reference" click to enter
The instrument has the characteristics of high measuring precision, high sensitivity, good stability, high intelligent degree, simple measurement, compact structure, convenient use etc..
The instrument is suitable for semiconductor material factory device factory, scientific research units, institutions of higher learning on conductive properties of conductor, semiconductor, semiconductor materials testing.
Three, the basic technical parameters
3.1 measuring range
Resistance: 1 × 10-4 ～ 2 × 105 Ω, resolution: 1 × 10-5 ～ 1 × 102 Ω
Resistivity: 1 × 10-4 ～ 2 × 105 Ω -cm, resolution: 1 × 10-5 ～ 1 × 102 Ω -cm
The square resistance: 5 × 10-4 ～ 2 × 105 Ω / □, resolution: 5 × 10-5 ～ 1 × 102 Ω / □
3.2 material size (determined by the selection of test bench and test mode)
Diameter: SZT-A circular test station direct measurement the diameter of 15 ~ 130mm, handheld mode is not limited
The SZT-B/C/F test bench direct measurement 180mm × 180mm, handheld mode is not limited.
Long (high) degree: test station direct measurement H ≤ 100mm, handheld mode is not limited.
Measuring range: axial, radial can be
3.3. 4-1/2 digital voltage meter:
(1) range: 20.00mV ~ 2000mV
(2) error: ± 0.1% ± 2 word reading
3.4 numerical control constant current source
(1) range: 0.1 μ A, 1 μ A, 10 μ A, 100 μ A, 1mA, 10mA, 100mA,
(2) error: ± 0.1% ± 2 word reading
3.5 four probe (matching one or plus all)
(1) tungsten probe: Φ 0.5mm, linear probe spacing 1.0mm, probe pressure: 0 ~ 2kg adjustabl
(2) thin film resistance probe: Φ 0.7mm, linear or square probe spacing 2.0mm, probe pressure: 0 ~ 0.6kg adjustabl
3.6. power supply
Input: AC 220V ± 10%, 50Hz power consumption: <20W
3.7. dimensions:
The main machine 220mm (long) x 245 mm (wide) x 100mm (high)
Net weight: ≤ 2.5kg
Four, the details please visit the Suzhou lattice electron Limited company official website http://www.sianaa.com or
See "ST2253 digital four probe tester technical manual"
Five, contact: 18914021918/0512-80973697 QQ:1064887318 Mr. Ding
